DIFFUSION BARRIER STUDIES FOR Cu.
- C.-K. Hu
- S. Chang
- et al.
- 1985
- VMIC 1985
Conference paper
Publications
22 results for J.E. Lewis
Summary Abstract: Investigation of the interface chemistry of titanium-tungsten Schottky barrier contacts to silicon by Auger spectroscopy
- J.E. Lewis
- M.O. Aboelfotoh
- et al.
- 1985
- JVSTA
PaperProperties of interfaces in (Cdzn)S/culnse2heterojunctions
- J.E. Lewis
- P.S. Ho
- et al.
- 1984
- JVSTA
PaperMaterial reactions Al/Pd2Si/Si junctions. II. Kinetic rates
- P.S. Ho
- J.E. Lewis
- et al.
- 1982
- Journal of Applied Physics
PaperMaterial reactions in Al/Pd2Si/Si junctions. I. Phase stability
- U. Köster
- P.S. Ho
- et al.
- 1982
- Journal of Applied Physics
PaperChemical bonding and reactions at the Pd/Si interface
- G.W. Rubloff
- P.S. Ho
- et al.
- 1981
- Physical Review B
PaperChemical bonding and electronic structure of Pd2Si
- P.S. Ho
- G.W. Rubloff
- et al.
- 1980
- Physical Review B
PaperPreferred sputtering on binary alloy surfaces of the AlPdSi system
- P.S. Ho
- J.E. Lewis
- et al.
- 1979
- Surface Science
PaperAuger study of preferred sputtering on binary alloy surfaces
- P.S Ho
- J.E Lewis
- et al.
- 1976
- Surface Science
PaperDeconvolution method for composition profiling by Auger sputtering technique
- P.S. Ho
- J.E. Lewis
- 1976
- Surface Science
Paper