Amorphization/templated recrystallization (ATR) method for hybrid orientation substrates
- K.L. Saenger
- J.P. De Souza
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paper
Publications
26886 results for Science
Systematic characterization of pseudomorphic (110) intrinsic SiGe epitaxial films for hybrid orientation technology with embedded SiGe source/drain
- Qiqing Ouyang
- Anita Madan
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paperEffects of BEOL stack on thermal mechanical stress of Cu lines
- Seung-Hyun Rhee
- Conal E. Murray
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paperThermal and electromigration-induced strains in copper conductor lines: X-ray microbeam measurements and analysis
- G. Wang
- H. Zhang
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paperElectrodeposition of gold on silicon nucleation and growth phenomena
- Q. Huang
- H. Deligianni
- et al.
- 2006
- JES
PaperElectrodeposition of Ni from low-temperature sulfamate electrolytes
- J. Kelly
- S.H. Goods
- et al.
- 2006
- JES
PaperControl of interfacial structure and electrical properties in MBE grown single crystalline SrTiO3 gate dielectrics on Si(100)
- Gerd Norga
- Chiara Marchiori
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paperCharacterization of HfO2/Si exposed to water vapor at room temperature
- Carlos Driemeier
- Elizandra Martinazzi
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paperTranslation invariance in a network of oscillatory units
- A. Ravishankar Rao
- Guillermo A. Cecchi
- et al.
- 2006
- IS&T/SPIE Electronic Imaging 2006
Conference paperA comparison of electrical and physical properties of MOCVD hafnium silicate thin films deposited using various silicon precursors
- P. Jamison
- M. Copel
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paper