Quality Assurance: Much More than Testing
- Stuart Feldman
- 2005
- Queue
Paper
Publications
26887 results for Science
Sense-and-respond grids for adaptive enterprises
- J.J. Jeng
- Lianjun An
- et al.
- 2005
- IT Professional
ReviewPhoton emission microscopy of inter/intra chip device performance variations
- S. Polonsky
- M. Bhushan
- et al.
- 2005
- ESREF 2005
Conference paperInnovative packaging technique for backside optical testing of wire-bonded chips
- A. Tosi
- F. Stellari
- et al.
- 2005
- ESREF 2005
Conference paperCharacterization of a 0.13 μm CMOS link chip using time resolved emission (TRE)
- Franco Stellari
- Peilin Song
- et al.
- 2005
- ESREF 2005
Conference paperPolymorphic one-dimensional (N2H4)2ZnTe: Soluble precursors for the formation of hexagonal or cubic zinc telluride
- David B. Mitzi
- 2005
- Inorganic Chemistry
PaperStructural properties of ErFe O3 in the spin-reorientation region
- L. Tsymbal
- V.I. Kamenev
- et al.
- 2005
- Physical Review B - CMMP
PaperNonadditivity of decoherence rates in superconducting qubits
- Guido Burkard
- Frederico Brito
- 2005
- Physical Review B - CMMP
PaperMulti-threaded testing with AOP is easy, and it finds bugs!
- Shady Copty
- Shmuel Ur
- 2005
- Euro-Par 2005
Conference paperEarly experience with scientific applications on the Blue Gene/L supercomputer
- George Almasi
- Gyan Bhanot
- et al.
- 2005
- EuroPar 2005
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