Fourier transform Raman spectroscopy of thin films
- C.G. Zimba
- V.M. Hallmark
- et al.
- 1988
- Thin Solid Films
Paper
Publications
14467 results for Physical Sciences
Main Lectures: Scanning tunneling microscopy
- G. Binnig
- 1988
- Zeitschrift fur Kristallographie - New Crystal Structures
PaperAuger decay of X-point excitons in a type II GaAs/AlGaAs superlattice
- T.W. Steiner
- D.J. Wolford
- et al.
- 1988
- Superlattices and Microstructures
PaperSpin-glass phase microwave study in high-TC superconductors
- K.W. Blazey
- A.M. Portis
- et al.
- 1988
- Physica C: Superconductivity and its applications
PaperEffects of processing conditions on the characteristics of platinum silicide Schottky barrier diodes
- D. Moy
- S. Basavaiah
- et al.
- 1988
- Solid State Electronics
PaperSummary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy
- J. Tersoff
- R.M. Feenstra
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperSummary Abstract: Scanning tunneling microscopy imaging and registration of the (v 3 x v3) R30° Ag/Si(111) surface
- R.J. Wilson
- S. Chiang
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperSome properties of ReSi2
- C. Krontiras
- L. Grönberg
- et al.
- 1988
- Thin Solid Films
PaperEstablishing an Instrumental Peak Profile Calibration Standard for Powder Diffraction Analyses: International Round Robin Conducted by the JCPDS-ICDD and the U.S. National Bureau of Standards
- T.G. Fawcett
- C.E. Crowder
- et al.
- 1988
- Powder Diffraction
PaperContrast Enhancement and Resist Wall Profile Control by Surface Crosslinkage
- H. Hiraoka
- 1988
- J. Photopolym. Sci. Tech.
Paper