300 mm wafer fabrication line simulation model
- Sameer T. Shikalgar
- David Fronckowiak
- et al.
- 2002
- WSC 2002
Conference paper
Publications
24910 results for Exploratory Science
Charge trapping in high K gate dielectric stacks
- Sufi Zafar
- Alessandro Callegari
- et al.
- 2002
- IEDM 2002
Conference paperNoise performance of a low base resistance 200 GHz SiGe technology
- D.R. Greenberg
- B. Jagannathan
- et al.
- 2002
- IEDM 2002
Conference paperMetal-gate FinFET and fully-depleted SOI devices using total gate silicidation
- Jakub Kedzierski
- Edward Nowak
- et al.
- 2002
- IEDM 2002
Conference paperSensitivity of a refractive beam reshaper to figure error
- John A. Hoffnagle
- 2002
- SPIE Optical Science and Technology 2002
Conference paperResist requirements and limitations for nanoscale electron-beam patterning
- J. Alexander Liddle
- Gregg M. Gallatin
- et al.
- 2002
- MRS Proceedings 2002
Conference paperBallistic FET modeling using QDAME: Quantum device analysis by modal evaluation
- Steven E. Laux
- Arvind Kumar
- et al.
- 2002
- IEEE TNANO
Conference paperSearching with numbers
- Rakesh Agrawal
- Ramakrishnan Srikant
- 2002
- WWW 2002
Conference paperRetrieving actions embedded in video
- Tanveer Syeda-Mahmood
- 2002
- MM 2002
Conference paperResynthesis of multi-level circuits under tight constraints using symbolic optimization
- Victor N. Kravets
- Karem A. Sakallah
- 2002
- ICCAD 2002
Conference paper