Ultra-fast measurements of the inversion charge in MOSFETs and impact on measured mobility in high-k MOSFETs
- D. Singh
- P. Solomon
- et al.
- 2004
- IEDM 2004
Conference paper
Publications
26898 results for Science
Exploring the impact of rfid on supply chain dynamics
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- Feng Cheng
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- 2004
- WSC 2004
Conference paperCharge trapping in aggressively scaled metal gate/high-κ stacks
- E. Gusev
- V. Narayanan
- et al.
- 2004
- IEDM 2004
Conference paperPerformance comparison and channel length scaling of strained Si FETs on SiGe-on-insulator (SGOI)
- J. Cai
- K. Rim
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- 2004
- IEDM 2004
Conference paperSelf-aligned carbon nanotube transistors with novel chemical doping
- Jia Chen
- Christian Klinke
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- 2004
- IEDM 2004
Conference paperInterface engineering for enhanced electron mobilities in W/HfO 2 gate stacks
- A.C. Callegari
- P. Jamison
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- 2004
- IEDM 2004
Conference paperMeeting the challenges of the digital medical enterprise of the future by reusing enterprise software components
- Uri Shani
- Tomer Kol
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- 2004
- SPIE Medical Imaging 2004
Conference paperAggressively scaled (0.143 μm 2) 6T-SRAM cell for the 32 nm node and beyond
- D. Fried
- J. Hergenrother
- et al.
- 2004
- IEDM 2004
Conference paperDesign and implementation of SIP network and client services
- Aameek Singh
- Priya Mahadevan
- et al.
- 2004
- ICCCN 2004
Conference paperCarbon nanotube electronics and optoelectronics
- Ph. Avouris
- A. Afzali
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- 2004
- IEDM 2004
Conference paper