Ultraviolet and violet GaN light emitting diodes on silicon
- Supratik Guha
- Nestor A. Bojarczuk
- 1998
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
PaperLocal determination of the stacking sequence of layered materials
- J. Fompeyrine
- R. Berger
- et al.
- 1998
- Applied Physics Letters
PaperCharacterization of substrate/thin-film interfaces with x-ray microdiffraction
- I.C. Noyan
- J.L. Jordan-Sweet
- et al.
- 1998
- Applied Physics Letters
PaperMott transition field effect transistor
- D.M. Newns
- J. Misewich
- et al.
- 1998
- Applied Physics Letters
PaperEffect of curvature and stress on reaction rates at solid interfaces
- J. Tersoff
- Yuhai Tu
- et al.
- 1998
- Applied Physics Letters
PaperField-dependent microsusceptometry on magnetic crystallites with integrated dc SQUIDs
- L.R. Narasimhan
- C.K.N. Patel
- et al.
- 1998
- Applied Physics Letters
PaperLinewidth and underlayer influence on texture in submicrometer-wide Al and AlCu lines
- J.L. Hurd
- K.P. Rodbell
- et al.
- 1998
- Applied Physics Letters
PaperBulk and surface characterization of a dewetting thin film polymer bilayer
- H. Ade
- D.A. Winesett
- et al.
- 1998
- Applied Physics Letters
PaperTemperature-dependent recombination in polymer composite light-emitting diodes
- L.D. Bozano
- S.E. Tuttle
- et al.
- 1998
- Applied Physics Letters
Paper