Temperature and bias dependence of magnetoresistance in doped manganite thin film trilayer junctions
- J.Z. Sun
- D.W. Abraham
- et al.
- 1998
- Applied Physics Letters
Paper
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2351 results at Applied Physics Letters
Characterization of substrate/thin-film interfaces with x-ray microdiffraction
- I.C. Noyan
- J.L. Jordan-Sweet
- et al.
- 1998
- Applied Physics Letters
PaperElectromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
PaperUltraviolet and violet GaN light emitting diodes on silicon
- Supratik Guha
- Nestor A. Bojarczuk
- 1998
- Applied Physics Letters
PaperLocal determination of the stacking sequence of layered materials
- J. Fompeyrine
- R. Berger
- et al.
- 1998
- Applied Physics Letters
PaperMott transition field effect transistor
- D.M. Newns
- J. Misewich
- et al.
- 1998
- Applied Physics Letters
PaperPhotothermal displacement measurement of transient melting and surface deformation during pulsed laser heating
- Shaochen Chen
- Costas P. Grigoropoulos
- et al.
- 1998
- Applied Physics Letters
PaperSequential position readout from arrays of micromechanical cantilever sensors
- H.P. Lang
- R. Berger
- et al.
- 1998
- Applied Physics Letters
PaperBulk and surface characterization of a dewetting thin film polymer bilayer
- H. Ade
- D.A. Winesett
- et al.
- 1998
- Applied Physics Letters
PaperLinewidth and underlayer influence on texture in submicrometer-wide Al and AlCu lines
- J.L. Hurd
- K.P. Rodbell
- et al.
- 1998
- Applied Physics Letters
Paper