Calorimetry in thin film processing
- S. Shivashankar
- B. Robinson
- 1986
- JVSTA
Paper
Publications
14462 results for Physical Sciences
Photothermal spectroscopy - Applications in surface sciences and in chemical analysis
- H. Coufal
- 1986
- Fresenius' Zeitschrift für Analytische Chemie
PaperSoft X-ray photoemission study of the silicon-fluorine etching reaction
- F.R. McFeely
- J.F. Morar
- et al.
- 1986
- Surface Science
PaperSurface processes leading to carbon contamination of photochemically deposited copper films
- F.A. Houle
- R.J. Wilson
- et al.
- 1986
- JVSTA
PaperX-ray photoelectron spectroscopy of polyacrylonitrile
- C.R. Wu
- W.R. Salaneck
- et al.
- 1986
- Synthetic Metals
PaperAES and EELS study of ErSi2 and its behaviour under ion bombardment and oxygen exposure
- S. Valeri
- U. del Pennino
- et al.
- 1986
- Solid State Communications
PaperScanning thermal profiler
- C.C. Williams
- H.K. Wickramasinghe
- 1986
- Microelectronic Engineering
PaperScanning tunneling microscopy
- H. Salemink
- 1986
- Microelectronic Engineering
PaperSilicon Micro Mechanics (SIMM): Si-beams with rectangular cross-section for atomic force sensing by means of STM
- O. Wolter
- J. Greschner
- et al.
- 1986
- Microelectronic Engineering
PaperChain scission efficiency and reactive‐ion etch resistance of alternating copolymers of styrene and olefins trisubstituted or tetrasubstituted with electron‐withdrawing groups
- Hiroshi Ito
- Claudia Hrusa
- et al.
- 1986
- Journal of Polymer Science Part A: Polymer Chemistry
Paper