Reliability limits for the gate insulator in CMOS technology
- 2002
- IBM J. Res. Dev
Review
Publications
24864 results for Exploratory Science
Thermodynamics of nucleation and growth
- Ruud M. Tromp
- James B. Hannon
- 2002
- Surface Review and Letters
ReviewChallenges and future directions for the scaling of dynamic random-access memory (DRAM)
- Jack A. Mandelman
- Robert H. Dennard
- et al.
- 2002
- IBM J. Res. Dev
ReviewAn architecture of diversity for commonsense reasoning
- J. McCarthy
- M. Minsky
- et al.
- 2002
- IBM Systems Journal
ReviewMultiple parameter continuation: Computing implicitly defined k-manifolds
- Michael E. Henderson
- 2002
- International Journal of Bifurcation and Chaos in Applied Sciences and Engineering
ReviewInterconnect opportunities for gigascale integration
- James D. Meindl
- Jeffrey A. Davis
- et al.
- 2002
- IBM J. Res. Dev
ReviewBeyond the conventional transistor
- H.-S. Philip Wong
- 2002
- IBM J. Res. Dev
ReviewOptical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
Conference paperDependence of post-breakdown conduction on gate oxide thickness
- S. Lombardo
- J.H. Stathis
- et al.
- 2002
- Microelectronics Reliability
Conference paperUser interfaces for applications on a wrist watch
- M.T. Raghunath
- Chandra Narayanaswami
- 2002
- Personal and Ubiquitous Computing
Conference paper