In depth generation lifetime profiling of heat‐treated czochralski silicon
- D. Braunig
- K.H. Yang
- et al.
- 1985
- physica status solidi (a)
Paper
Publications
14462 results for Physical Sciences
Background and applications of electron beam test techniques
- Fritz J. Hohn
- 1985
- Microelectronic Engineering
PaperA comparison of the electron beam sensitivities and relative oxygen plasma etch rates of various organosilicon polymers
- E. Babich
- J. Paraszczak
- et al.
- 1985
- Microelectronic Engineering
PaperProperties and Microelectronic Applications of Thin Films of Refractory Metal Nitrides
- Marc Wittmer
- 1985
- JVSTA
PaperPolymerization of two unsaturated fatty acid esters in Langmuir-Blodgett films as studied by IR spectroscopy
- J. Rabe
- J.F. Rabolt
- et al.
- 1985
- Thin Solid Films
PaperStructural characterization of a polymer monolayer on a solid surface
- Stephen J. Mumby
- J.F. Rabolt
- et al.
- 1985
- Thin Solid Films
PaperStructure and properties of coevaporated WSix films
- K.Y. Ahn
- S.R. Herd
- et al.
- 1985
- JVSTA
PaperCoverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction
- M. Pomerantz
- A. Segmüller
- et al.
- 1985
- Thin Solid Films
PaperLithographic image simulations
- Douglas S. Goodman
- 1985
- Microelectronic Engineering
PaperUnoccupied surface state and conduction band critical points of GaP(110): A high resolution inverse photoemission study
- D. Straub
- M. Skibowski
- et al.
- 1985
- JVSTA
Paper