Background and applications of electron beam test techniques
- Fritz J. Hohn
- 1985
- Microelectronic Engineering
Paper
Publications
14466 results for Physical Sciences
Summary Abstract: Energy distributions of electronically excited molecules produced by ion bombardment of silicon
- R.E. Walkup
- Ph. Avouris
- 1985
- JVSTA
PaperSummary Abstract: High resolution synchrotron photoemission study of silicon-metal interfaces
- P.S. Ho
- 1985
- JVSTA
PaperKinetic segregation of AlAs-GaAs during 〈110〉 MBE
- J.A. Van Vechten
- 1985
- Journal of Crystal Growth
PaperLattice relaxation in aluminum monolayers
- Inder P. Batra
- 1985
- JVSTA
PaperEffect of ion bombardment during deposition on the x-ray microstructure of thin silver films
- T.C. Huang
- G. Lim
- et al.
- 1985
- JVSTA
PaperStress modification of WSi2.2 films by concurrent low energy ion bombardment during alloy evaporation
- D.S. Yee
- J. Floro
- et al.
- 1985
- JVSTA
PaperCation radical salts with magnetic anions: Preparation and characterization of FeCl4 salts of TMTTF and TMTSF
- P. Batail
- L. Ouahab
- et al.
- 1985
- Solid State Communications
PaperA comparison of the electron beam sensitivities and relative oxygen plasma etch rates of various organosilicon polymers
- E. Babich
- J. Paraszczak
- et al.
- 1985
- Microelectronic Engineering
PaperAblative photodecomposition of polymers
- R. Srinivasan
- 1985
- JVSTA
Paper