Electrically detected magnetic resonance study of stress-induced leakage current in thin SiO2
- 1996
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Cu segregation at the Al(Cu)/Al2O3 interface
- M. Copel
- K.P. Rodbell
- et al.
- 1996
- Applied Physics Letters
PaperLow field giant magnetoresistance in sputtered permalloy/Au multilayers
- S.S.P. Parkin
- T.A. Rabedeau
- 1996
- Applied Physics Letters
PaperElectric field controllable Josephson junctions of high quality in high-Tc superconductors
- B. Mayer
- J. Mannhart
- et al.
- 1996
- Applied Physics Letters
PaperMicrostructure of AlGaAs-oxide heterolayers formed by wet oxidation
- S. Guha
- F. Agahi
- et al.
- 1996
- Applied Physics Letters
PaperStructures and dielectric properties of thin polyimide films with nano-foam morphology
- H.J. Cha
- J.L. Hedrick
- et al.
- 1996
- Applied Physics Letters
PaperHigh pressure oxidation induced stress in submicron trench structures
- R. Stengl
- H.-J. Timme
- et al.
- 1996
- Applied Physics Letters
PaperPhotoemission assignments of HxSiO4-x fragments at the Si/SiOx interface
- Sunghee Lee
- Mark M. Banaszak Holl
- et al.
- 1996
- Applied Physics Letters
PaperThermal stability of undoped strained Si channel SiGe heterostructures
- H. Klauk
- T.N. Jackson
- et al.
- 1996
- Applied Physics Letters
PaperScattering spectroscopy of molecules at nanometer resolution
- Y. Martin
- F. Zenhausern
- et al.
- 1996
- Applied Physics Letters
Paper