Thickness measurement of ultra-thin gate dielectrics under inversion condition
- W. Zhu
- Mukesh Khare
- et al.
- 2001
- International Symposium on VLSI Technology, Systems, and Applications, Proceedings
Paper
Publications
24866 results for Exploratory Science
Opportunities and challenges in ultra low k dielectrics for interconnect applications
- S. Purushothaman
- S.V. Nitta
- et al.
- 2001
- Technical Digest-International Electron Devices Meeting
PaperFactors affecting the implementation of process based change
- Zoé Nash
- Steve Childe
- et al.
- 2001
- International Journal of Technology Management
PaperKnowledge management technology
- A.D. Marwick
- 2001
- IBM Systems Journal
PaperJoint smoothing and source rate selection for guaranteed service networks
- Olivier Verscheure
- Pascal Frossard
- et al.
- 2001
- Proceedings - IEEE INFOCOM
PaperOn the effectiveness of DNS-based server selection
- Anees Shaikh
- Renu Tewari
- et al.
- 2001
- Proceedings - IEEE INFOCOM
PaperUniquely restricted matchings
- Martin C. Golumbic
- T. Hirst
- et al.
- 2001
- Algorithmica (New York)
PaperVisualization and analysis of clickstream data of online stores for understanding web merchandising
- Juhnyoung Lee
- Mark Podlaseck
- et al.
- 2001
- Data Mining and Knowledge Discovery
PaperOn the refinement of the binary symmetric markov source
- Luis Lastras
- Toby Berger
- 2001
- IEEE International Symposium on Information Theory - Proceedings
PaperMechanical properties of thermo-reversible colloid liquid crystal composites
- J. Crain
- S.P. Meeker
- et al.
- 2001
- Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals
Paper