Ion scattering for in situ characterization of composition of La 2-xSrxCuO4 films
- P.K. Hucknall
- S. Sugden
- et al.
- 1995
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Reduction of the C54-TiSi2 phase transformation temperature using refractory metal ion implantation
- R. Mann
- G.L. Miles
- et al.
- 1995
- Applied Physics Letters
PaperIndium distribution in InGaAs quantum wires observed with the scanning tunneling microscope
- M. Pfister
- M. Johnson
- et al.
- 1995
- Applied Physics Letters
PaperElectrically detected magnetic resonance study of stress-induced leakage current in thin SiO2
- 1995
- Applied Physics Letters
PaperOn the formation of epitaxial CoSi2 from the reaction of Si with a Co/Ti bilayer
- S.-L. Zhang
- J. Cardenas
- et al.
- 1995
- Applied Physics Letters
PaperMagnetic field induced broadening of the resistive transition in epitaxial c-axis-oriented HgBa2CaCu2O6+δ films
- M. Rupp
- A. Gupta
- et al.
- 1995
- Applied Physics Letters
PaperUV modification of surface pretilt of alignment layers for multidomain liquid crystal displays
- Alan Lien
- R.A. John
- et al.
- 1995
- Applied Physics Letters
PaperCu segregation at the Al(Cu)/Al2O3 interface
- M. Copel
- K.P. Rodbell
- et al.
- 1995
- Applied Physics Letters
PaperFlexible giant magnetoresistance sensors
- S.S.P. Parkin
- 1995
- Applied Physics Letters
PaperGrowth and giant magnetoresistance properties of La-deficient La xMnO3-δ (0.67≤x≤1) films
- A. Gupta
- T.R. McGuire
- et al.
- 1995
- Applied Physics Letters
Paper