Electrically detected magnetic resonance study of stress-induced leakage current in thin SiO2
- 1995
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Cu segregation at the Al(Cu)/Al2O3 interface
- M. Copel
- K.P. Rodbell
- et al.
- 1995
- Applied Physics Letters
PaperSingle-gate multichannel amorphous silicon thin-film transistors
- Yue Kuo
- 1995
- Applied Physics Letters
PaperField emission switch
- Gary M. McClelland
- Fumiya Watanabe
- 1995
- Applied Physics Letters
PaperLow field giant magnetoresistance in sputtered permalloy/Au multilayers
- S.S.P. Parkin
- T.A. Rabedeau
- 1995
- Applied Physics Letters
PaperIndium distribution in InGaAs quantum wires observed with the scanning tunneling microscope
- M. Pfister
- M. Johnson
- et al.
- 1995
- Applied Physics Letters
PaperPhotoemission assignments of HxSiO4-x fragments at the Si/SiOx interface
- Sunghee Lee
- Mark M. Banaszak Holl
- et al.
- 1995
- Applied Physics Letters
PaperNear-field optical data storage
- B.D. Terris
- H.J. Mamin
- et al.
- 1995
- Applied Physics Letters
PaperLarge second-order optical nonlinearities in pulsed laser ablated silicon carbide thin films
- Paul M. Lundquist
- H.C. Ong
- et al.
- 1995
- Applied Physics Letters
PaperThermal stability of undoped strained Si channel SiGe heterostructures
- H. Klauk
- T.N. Jackson
- et al.
- 1995
- Applied Physics Letters
Paper