Electronic states and microstructure at the silicide-silicon interface
- P.S. Ho
- G.W. Rubloff
- 1982
- Thin Solid Films
Paper
Publications
14460 results for Physical Sciences
Imaging performance of a normal incidence x-ray telescope measured at 0.18 kev
- J.P. Henry
- Eberhard Spiller
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperObservation of rotational polarization produced in molecule-surface collisions
- A.C. Luntz
- A.W. Kleyn
- et al.
- 1982
- Physical Review B
PaperNew dimerized-chain model for the reconstruction of the diamond (111)-(2 × 1) surface
- K.C. Pandey
- 1982
- Physical Review B
PaperInterface states at the Pt silicide-Si interface
- G.W. Rubloff
- 1982
- Physical Review B
PaperLattice dynamics of mixed-valent SmS
- H.A. Mook
- D.B. McWhan
- et al.
- 1982
- Physical Review B
PaperStrain relaxation mechanisms of lead and lead alloy thin films on silicon substrates
- Masanori Murakami
- Tung-Sheng Kuan
- et al.
- 1982
- Thin Solid Films
PaperA computer calculation of step coverage in SiO thin films
- G.R. Proto
- I.A. Blech
- et al.
- 1982
- Thin Solid Films
PaperThe electronic structure of impurities and defects in SiO2
- Sokrates T. Pantelides
- 1982
- Thin Solid Films
PaperAdsorbate band dispersions for C on Ru(0001)
- F.J. Himpsel
- K. Christmann
- et al.
- 1982
- Surface Science
Paper