Influence of misfit dislocations on the surface morphology of Si1-xGex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1995
- Applied Physics Letters
Paper
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2351 results at Applied Physics Letters
Evolution of strain relaxation in step-graded SiGe/Si structures
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1995
- Applied Physics Letters
PaperSurfactants in Si(111) homoepitaxy
- M. Horn-Von Hoegen
- J. Falta
- et al.
- 1995
- Applied Physics Letters
PaperQuantitative measurement of the stress transfer function in nickel/polyimide thin film/copper thin film structures
- L.S. Schadler
- I.C. Noyan
- 1995
- Applied Physics Letters
PaperChemical bonding and atomic structure of Rb+ exchanged KTiOPO4 waveguides probed by micro-Raman spectroscopy
- David D. Tuschel
- Gustavo R. Paz-Pujalt
- et al.
- 1995
- Applied Physics Letters
PaperIn situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
- L. Clevenger
- et al.
- 1995
- Applied Physics Letters
PaperThin-film temperature rise estimates during low energy ion bombardment in a plasma reactor
- M. Naeem
- D. Chidambarrao
- 1995
- Applied Physics Letters
PaperDefect generation in 3.5 nm silicon dioxide films
- D.A. Buchanan
- D.J. DiMaria
- et al.
- 1994
- Applied Physics Letters
PaperMagnetic and magneto-optic properties of thick face-centered-cubic Co single-crystal films
- T. Suzuki
- D. Weller
- et al.
- 1994
- Applied Physics Letters
PaperAtomic structure and luminescence excitation of GaAs/(AlAs) n(GaAs)m quantum wires with the scanning tunneling microscope
- M. Pfister
- M. Johnson
- et al.
- 1994
- Applied Physics Letters
Paper