Epitaxial Fe16N2 films grown on Si(001) by reactive sputtering
- M.A. Brewer
- Kannan M. Krishnan
- et al.
- 1996
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Degradation and failure of MEH-PPV light-emitting diodes
- J.C. Scott
- J.H. Kaufman
- et al.
- 1996
- Journal of Applied Physics
PaperThe role of texture in the electromigration behavior of pure aluminum lines
- D.B. Knorr
- K.P. Rodbell
- 1996
- Journal of Applied Physics
PaperTwo-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy
- E.T. Yu
- K. Barmak
- et al.
- 1996
- Journal of Applied Physics
PaperThree-dimensional imaging with a nuclear magnetic resonance force microscope
- O. Züger
- S.T. Hoen
- et al.
- 1996
- Journal of Applied Physics
PaperAmorphous (Mo, Ta, or W)-Si-N diffusion barriers for Al metallizations
- J.S. Reid
- E. Kolawa
- et al.
- 1996
- Journal of Applied Physics
PaperInterface states induced by the presence of trapped holes near the silicon-silicon-dioxide interface
- D.J. DiMaria
- D.A. Buchanan
- et al.
- 1995
- Journal of Applied Physics
PaperNear-threshold laser sputtering of gold
- Ted D. Bennett
- Costas P. Grigoropoulos
- et al.
- 1995
- Journal of Applied Physics
PaperDissociation kinetics of hydrogen-passivated (100) Si/SiO2 interface defects
- J.H. Stathis
- 1995
- Journal of Applied Physics
PaperRole of the chamber wall in low-pressure high-density etching plasmas
- James A. O'Neill
- Jyothi Singh
- 1995
- Journal of Applied Physics
Paper