Publications

2360 results at Journal of Applied Physics

Epitaxial Fe₁₆N₂ films grown on Si(001) by reactive sputtering
- - M.A. Brewer
  - Kannan M. Krishnan
  - et al.
- 1996
- Journal of Applied Physics
Paper
Degradation and failure of MEH-PPV light-emitting diodes
- - J.C. Scott
  - J.H. Kaufman
  - et al.
- 1996
- Journal of Applied Physics
Paper
The role of texture in the electromigration behavior of pure aluminum lines
- - D.B. Knorr
  - K.P. Rodbell
- 1996
- Journal of Applied Physics
Paper
Two-dimensional profiling of shallow junctions in Si metal-oxide-semiconductor structures using scanning tunneling spectroscopy and transmission electron microscopy
- - E.T. Yu
  - K. Barmak
  - et al.
- 1996
- Journal of Applied Physics
Paper
Three-dimensional imaging with a nuclear magnetic resonance force microscope
- - O. Züger
  - S.T. Hoen
  - et al.
- 1996
- Journal of Applied Physics
Paper
Amorphous (Mo, Ta, or W)-Si-N diffusion barriers for Al metallizations
- - J.S. Reid
  - E. Kolawa
  - et al.
- 1996
- Journal of Applied Physics
Paper
Investigation of titanium silicide formation in Ti+Si reactions using infrared spectroscopy and x-ray diffraction
- - K.L. Saenger
  - C. Cabral Jr.
  - et al.
- 1995
- Journal of Applied Physics
Paper
Near-threshold laser sputtering of gold
- - Ted D. Bennett
  - Costas P. Grigoropoulos
  - et al.
- 1995
- Journal of Applied Physics
Paper
In situ scanning electron microscope comparison studies on electromigration of Cu and Cu(Sn) alloys for advanced chip interconnects
- - K.-L. Lee
  - C.-K. Hu
  - et al.
- 1995
- Journal of Applied Physics
Paper
Dissociation kinetics of hydrogen-passivated (100) Si/SiO₂ interface defects
- - J.H. Stathis
- 1995
- Journal of Applied Physics
Paper