Dependence of post-breakdown conduction on gate oxide thickness
- S. Lombardo
- J.H. Stathis
- et al.
- 2002
- Microelectronics Reliability
Conference paper
Publications
26911 results for Science
In situ resistivity study of copper-cobalt films: Precipitation, dissolution and phase transformation
- S.-L. Zhang
- J.M.E. Harper
- et al.
- 2001
- Thin Solid Films
PaperMössbauer studies of α″-Fe16N2 and α′-Fe8N films
- Z.W. Li
- A.H. Morrish
- et al.
- 2001
- Journal of Materials Science
PaperTransport in nanoscale conductors from first principles
- Massimiliano Di Ventra
- Norton D. Lang
- 2001
- Physical Review B - CMMP
PaperAudio-visual event detection using duration dependent input output Markov models
- M. Naphade
- A. Garg
- et al.
- 2001
- CBAIVL 2001
Conference paperPatterning indium tin oxide and indium zinc oxide using microcontact printing and wet etching
- Tricia L. Breen
- Peter M. Fryer
- et al.
- 2001
- Langmuir
PaperConsequences of unconventional order parameter symmetry-high critical temperature structures
- A. Barone
- J.R. Kirtley
- et al.
- 2001
- Nobel Jubilee Symposium 2001
Conference paperGene expression profiling of B cell chronic lymphocytic leukemia reveals a homogeneous phenotype related to memory B cells
- Ulf Klein
- Yuhai Tu
- et al.
- 2001
- Journal of Experimental Medicine
PaperInterfacially dominated giant magnetoresistance in Fe/Cr superlattices
- J. Santamaria
- M.-E. Gomez
- et al.
- 2001
- Physical Review B - CMMP
PaperStructure of the silicon-oxide interface
- Yuhai Tu
- J. Tersoff
- 2001
- Thin Solid Films
Conference paper