Relative entropy and exponential deviation bounds for general markov chains
- I. Kontoyiannis
- L.A. Lastras-Montaño
- et al.
- 2005
- ISIT 2005
Conference paper
Publications
3613 results for Mathematical Sciences
Testing and debugging delay faults in dynamic circuits
- Ramyanshu Datta
- Sani Nassif
- et al.
- 2005
- IEEE ITC 2005
Conference paperLow-k/copper integration scheme suitable for ULSI manufacturing from 90nm to 45nm nodes
- T. Nogami
- S. Lane
- et al.
- 2005
- Optics East 2005
Conference paperOn the limitations of universally composable two-party computation without set-up assumptions
- Ran Canetti
- Eyal Kushilevitz
- et al.
- 2005
- Journal of Cryptology
PaperAnalysis of stochastic online bin packing processes
- David Gamarnik
- Mark S. Squillante
- 2005
- Stochastic Models
Conference paperDiaphony, discrepancy, spectral test and worst-case error
- Josef Dick
- Friedrich Pillichshammer
- 2005
- Mathematics and Computers in Simulation
PaperHamiltonian completions of sparse random graphs
- David Gamarnik
- Maxim Sviridenko
- 2005
- Discrete Applied Mathematics
PaperAntenna-based near-field scanning optical microscopy
- Hendrik F. Hamann
- 2005
- SPIE Antenna-based near-field scanning optical microscopy 2005
Conference paperToward through-process layout quality metrics
- Fook-Luen Heng
- Jin-Fuw Lee
- et al.
- 2005
- Microlithography 2005
Conference paperIntegrating DfM components into a cohesive design-to-silicon solution
- Lars Liebmann
- Dan Maynard
- et al.
- 2005
- Microlithography 2005
Conference paper