Lithographic characteristics of 193-nm resists imaged at 193 and 248 nm
- Juliann Opitz
- Robert D. Allen
- et al.
- 1998
- Microlithography 1998
Conference paper
Publications
25372 results for Science
On the properties of capacity regions in multi-user networks
- J. Thomas
- 1998
- ISIT 1998
Conference paperInjection, transport and recombination in organic light-emitting diodes
- J.C. Scott
- George G. Malliaras
- et al.
- 1998
- SPIE Optical Science, Engineering, and Instrumentation 1998
Conference paperDesigning a testable System on a Chip
- S.V. Kosonocky
- A.A. Bright
- et al.
- 1998
- VTS 1998
Conference paper25 nm CMOS design considerations
- Y. Taur
- C. Wann
- et al.
- 1998
- IEDM 1998
Conference paperProgress in RF inductors on silicon - understanding substrate losses
- J.N. Burghartz
- 1998
- IEDM 1998
Conference paperRange-based bitmap indexing for high cardinality attributes with skew
- Kun-Lung Wu
- Philip S. Yu
- 1998
- COMPSAC 1998
Conference paper"Copper chip" technology
- D. Edelstein
- 1998
- Microelectronic Manufacturing 1998
Conference paperThe match score image: A visualization tool for image query refinement
- Lawrence D. Bergman
- Vittorio Castelli
- 1998
- SPIE Photonics West 1998
Conference paperResults of attacks on a claimed robust digital image watermark
- Gordon W. Braudaway
- 1998
- SPIE Photonics West 1998
Conference paper