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- 2013
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Publications
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22nm technology yield optimization using multivariate 3D virtual fabrication
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- 2013
- SISPAD 2013
Conference paperEnhancing quality of it services delivery using enterprise crowdsourcing
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- Arjun Natarajan
- 2013
- IJCIS: Cooperative Information Systems
PaperDependency design for large cloud applications
- Rui Liu
- Xin Sheng Mao
- 2013
- ICCSA 2013
Conference paperDefects on high resolution negative-tone resist The revenge of the blobs
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- 2013
- SPIE Photomask Technology + EUV Lithography 2013
Conference paperA robot-in-the-loop face detection and recognition system with coordinaive control platform
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- 2013
- ROBIO 2013
Conference paperYour worst Nightmare - Inspection of aggressive OPC on 14 nm masks with emphasis on defect sensitivity and wafer defect print predictability
- Karen D. Badger
- Michael Hibbs
- et al.
- 2013
- SPIE Photomask Technology 2013
Conference paperTwo-dimensional mask effects at the 14 nm logic node
- A.E. Zweber
- A.E. McGuire
- et al.
- 2013
- SPIE Photomask Technology 2013
Conference paperThermal probe nanolithography: In-situ inspection, high-speed, high-resolution, 3D
- Felix Holzner
- Philip Paul
- et al.
- 2013
- EMLC 2013
Conference paperA network of rails: A graph dataset of ruby on rails and associated projects
- Patrick Wagstrom
- Corey Jergensen
- et al.
- 2013
- MSR 2013
Conference paper