Interface state capture cross section measurements on vacuum annealed and radiation damaged Si:SiO2 surfaces
- M.J. Uren
- V. Nayar
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- 1998
- JES
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Publications
25372 results for Science
Platform-dependent properties of 193nm single layer resists
- Robert D. Allen
- Thomas I. Wallow
- et al.
- 1998
- J. Photopolym. Sci. Tech.
PaperCombination of single crystal zeolites and microfabrication: Two applications towards zeolite nanodevices
- L. Scandella
- G. Binder
- et al.
- 1998
- Microporous and Mesoporous Materials
PaperNematic LC modes and LC phase gratings for reflective spatial light modulators
- K.H. Yang
- M. Lu
- 1998
- IBM J. Res. Dev
PaperMagnetic and magneto-optical properties of NiMnSb thin films
- J.A. Caballero
- W.J. Geerts
- et al.
- 1998
- Journal of Magnetism and Magnetic Materials
PaperFirst principles investigations of a "quasi-one-dimensional" charge-transfer molecular crystal: TTF-2,5Cl2BQ
- C. Katan
- C. Koenig
- et al.
- 1998
- Computational Materials Science
PaperParallel randomized load balancing
- Micah Adler
- Soumen Chakrabarti
- et al.
- 1998
- Random Structures and Algorithms
PaperApplications of electrochemical microfabrication: An introduction
- M. Datta
- 1998
- IBM J. Res. Dev
PaperAccuracy and efficiency in electron beam proximity effect correction
- S.J. Wind
- P.D. Gerber
- et al.
- 1998
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperGrowth of bismuth titanate films by chemical vapor deposition and chemical solution deposition
- Deborah A. Neumayer
- Peter R. Buncombe
- et al.
- 1998
- Integrated Ferroelectrics
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