Layout Optimization at the pinnacle of Optical Lithography
- Lars Liebmann
- Greg Northrop
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Conference paper
Publications
3613 results for Mathematical Sciences
Failure prediction across process window for robust OPC
- Shumay D. Shang
- Yuri Granik
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Conference paperApplications of image diagnostics to metrology quality assurance and process control
- John A. Allgair
- Victor V. Boksha
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Conference paperColor Image Semantics for Digital Libraries
- Aleksandra Mojsilovic
- Bernice E. Rogowitz
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperApplication of blurring filters to improve detection of invisible image watermarks
- Gordon W. Braudaway
- Fred Mintzer
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperWatching chips work: Optical imaging of hot carriers in ICs
- J.C. Tsang
- 2002
- ECS Meeting 2002
Conference paperLearning to see, seeing to learn: Visual aspects of sensemaking
- Daniel M. Russell
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperDigital Image Acquisition and Continuous Zoom Display from Multiple-Resolution Views Using Heterogeneous Image Pyramids
- Belle L. Tseng
- 2003
- VDA 2003
Conference paperPerceptual Color and Spatial Texture Features for Segmentation
- Junqing Chen
- Thrasyvoulos N. Pappas
- et al.
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperOptical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Conference paper