In situ TEM study of the growth of Ge on Si(111)
- F.K. LeGoues
- M. Hammar
- et al.
- 1996
- Surface Science
Paper
Publications
25372 results for Science
LiCi induced morphological changes in polyaniline base and their effect on the electronic properties of the doped form
- Marie Angelopoulos
- Yun-Hsin Liao
- et al.
- 1996
- Macromolecules
PaperDependence of crystallographic texture of C54 TiSi2 on thickness and linewidth in submicron CMOS structures
- V. Svilan
- K.P. Rodbell
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paperResidual stress and lattice distortion mapping of patterned devices which failed electromigration testing using the microbeam X-ray diffraction (MXRD) technique
- B.R. York
- H.L. Pfizenmayer
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paper0.1 μm technology and BEOL
- T.H. Ning
- 1996
- MRS Spring Meeting 1996
Conference paperCopper migration and precipitate dissolution in aluminum/copper lines during electromigration testing
- T.M. Shaw
- C.-K. Hu
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paperElectromigration and diffusion in pure Cu and Cu(Sn) alloys
- C.-K. Hu
- K.L. Lee
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paperMicroporous crosslinked elastomers
- J.L. Hedrick
- S.A. Srinivasan
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paperNanofoam porosity measured by infrared spectroscopy and refractive index
- M.I. Sanchez
- J.L. Hedrick
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paperPhase formation in Cu(Sn) alloy thin films
- L. Clevenger
- B. Arcot
- et al.
- 1996
- MRS Spring Meeting 1996
Conference paper