Low-temperature magnetic resonance force detection
- K. Wago
- O. Züger
- et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Publications
25372 results for Science
Variation of the effective elastic constants in the sample coordinate system with tilt angle (ψ) for X-ray strain-stress analysis
- Yongchu Song
- I.C. Noyan
- 1996
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
PaperEffect of a surface layer on the stress relaxation of thin films
- M.D. Thouless
- K.P. Rodbell
- et al.
- 1996
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperImage placement errors in x-ray masks induced by changes in resist stress during electron-beam writing
- R.E. Acosta
- Denise Puisto
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperOrigin of the φ ∼ ±9° peaks in YBa2Cu3O7-δ films grown on cubic zirconia substrates
- D.G. Schlom
- E.S. Hellman
- et al.
- 1996
- Journal of Materials Research
PaperA document recognition system and its applications
- A. Yamashita
- T. Amano
- et al.
- 1996
- IBM J. Res. Dev
PaperDevelopment of 111 texture in Al films grown on SiO2/Si(001) by ultrahigh-vacuum primary-ion deposition
- Y.W. Kim
- I. Petrov
- et al.
- 1996
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperRole of gas phase reactions in subatmospheric chemical-vapor deposition ozone/TEOS processes for oxide deposition
- I.A. Shareef
- G.W. Rubloff
- et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperProgress in 193 nm positive resists
- R.D. Allen
- R. Soortyakumaran
- et al.
- 1996
- J. Photopolym. Sci. Tech.
PaperNanolithography with an atomic force microscope
- M. Wendel
- B. Irmer
- et al.
- 1996
- Superlattices and Microstructures
Paper