193 nm photoresist r&d: the risk & challenge
- Donald C. Hofer
- Robert Allen
- et al.
- 1996
- J. Photopolym. Sci. Tech.
Paper
Publications
25372 results for Science
Personal area networks: Near-field intrabody communication
- T.G. Zimmerman
- 1996
- IBM Systems Journal
PaperIonized physical vapor deposition of Cu for high aspect ratio damascene trench fill applications
- C. Nichols
- S.M. Rossnagel
- et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperRadiation coupling and image formation in scanning near-field optical microscopy
- D. Pohl
- L. Novotny
- et al.
- 1996
- Thin Solid Films
PaperFinding mixed strategies with small supports in extensive form games
- Daphne Koller
- Nimrod Megiddo
- 1996
- International Journal of Game Theory
PaperVoronoi diagrams of polygons: A framework for shape representation
- Niranjan Mayya
- V.T. Rajan
- 1996
- Journal of Mathematical Imaging and Vision
PaperA study of X-ray reflectivity data analysis methods for thin film thickness determination
- D.T. Brower
- R.E. Revay
- et al.
- 1996
- Powder Diffraction
PaperStability analysis of lattice boltzmann methods
- James D. Sterling
- Shiyi Chen
- 1996
- Journal of Computational Physics
PaperAccelerated testing for cosmic soft-error rate
- J.F. Ziegler
- H.P. Muhlfeld
- et al.
- 1996
- IBM J. Res. Dev
PaperQuantitative micromagnetics at high spatial resolution using far-out-of-focus STEM electron holography
- M. Mankos
- J.M. Cowley
- et al.
- 1996
- Physica Status Solidi (A) Applied Research
Paper