Reactive ion etch damages in inverted, trilayer thin-film transistor
- Yue Kuo
- 1992
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Atomic scale imaging of hydroxyapatite and brushite in air by force microscopy
- Lorraine M. Siperko
- William J. Landis
- 1992
- Applied Physics Letters
PaperJosephson oscillations and noise temperatures in YBa2Cu 3O7-x grain-boundary junctions
- Yu.Ya. Divin
- J. Mygind
- et al.
- 1992
- Applied Physics Letters
PaperKinetics of nucleation and growth of Si on SiO2 in very low pressure SiH4 chemical vapor deposition
- S.S. Dana
- M. Liehr
- et al.
- 1992
- Applied Physics Letters
PaperEllipsometric study of silicon surface damage in electron cyclotron resonance plasma etching using CF4 and SF6
- M. Haverlag
- D. Vender
- et al.
- 1992
- Applied Physics Letters
PaperDegradation and breakdown of silicon dioxide films on silicon
- D.J. Dimaria
- D. Arnold
- et al.
- 1992
- Applied Physics Letters
PaperEvaporated CoPt alloy films with strong perpendicular magnetic anisotropy
- C.-J. Lin
- G. Gorman
- 1992
- Applied Physics Letters
PaperNoninvasive picosecond ultrasonic detection of ultrathin interfacial layers: CFx at the Al/Si interface
- G. Tas
- R.J. Stoner
- et al.
- 1992
- Applied Physics Letters
PaperCharge trapping centers in N-rich silicon nitride thin films
- W.L. Warren
- Jerzy Kanicki
- et al.
- 1992
- Applied Physics Letters
PaperRe-evaluation of the thermal stability of optically nonlinear polymeric guest-host systems
- M. Stähelin
- D.M. Burland
- et al.
- 1992
- Applied Physics Letters
Paper