Photoinduced hydrogen loss from porous silicon
- R.T. Collins
- M.A. Tischler
- et al.
- 1992
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Charge trapping centers in N-rich silicon nitride thin films
- W.L. Warren
- Jerzy Kanicki
- et al.
- 1992
- Applied Physics Letters
PaperNoninvasive picosecond ultrasonic detection of ultrathin interfacial layers: CFx at the Al/Si interface
- G. Tas
- R.J. Stoner
- et al.
- 1992
- Applied Physics Letters
PaperEvaporated CoPt alloy films with strong perpendicular magnetic anisotropy
- C.-J. Lin
- G. Gorman
- 1992
- Applied Physics Letters
PaperDegradation and breakdown of silicon dioxide films on silicon
- D.J. Dimaria
- D. Arnold
- et al.
- 1992
- Applied Physics Letters
PaperEllipsometric study of silicon surface damage in electron cyclotron resonance plasma etching using CF4 and SF6
- M. Haverlag
- D. Vender
- et al.
- 1992
- Applied Physics Letters
PaperJosephson oscillations and noise temperatures in YBa2Cu 3O7-x grain-boundary junctions
- Yu.Ya. Divin
- J. Mygind
- et al.
- 1992
- Applied Physics Letters
PaperAtomic scale imaging of hydroxyapatite and brushite in air by force microscopy
- Lorraine M. Siperko
- William J. Landis
- 1992
- Applied Physics Letters
PaperIn situ study of relaxation of SiGe thin films by the modified Frank-Read mechanism
- F.K. LeGoues
- J.A. Ott
- et al.
- 1992
- Applied Physics Letters
PaperHigh-density optical storage based on nanometer-size arsenic clusters in low-temperature-growth GaAs
- D.D. Nolte
- M.R. Melloch
- et al.
- 1992
- Applied Physics Letters
Paper