Image force effects and the dielectric response of SiO2 in electron transport across metal-oxide-semiconductor structures
- H.J. Wen
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- 1997
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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Publications
26934 results for Science
Reliability and integration of ultra-thin gate dielectrics for advanced CMOS
- D.A. Buchanan
- S.H. Lo
- 1997
- Microelectronic Engineering
PaperMinimum emission current of liquid metal ion sources
- J.C. Beckman
- T.H.P. Chang
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- 1997
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperExplanation for the oxide thickness dependence of breakdown characteristics of metal-oxide-semiconductor structures
- D.J. Dimaria
- 1997
- Microelectronic Engineering
PaperA detailed derivation of extended jones matrix representation for twisted nematic liquid crystal displays
- Alan Lien
- 1997
- Liquid Crystals
PaperIons and atoms in superfluid helium (4He). IV. Temperature dependence of the mobility of alkali earth ions
- M. Foerste
- H. Guenther
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- 1997
- Zeitschrift fur Physik B-Condensed Matter
PaperComputing elastic moduli of two-dimensional random networks of rigid and nonrigid bonds by simulated annealing
- A. Albrecht
- S.K. Cheung
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- 1997
- Mathematics and Computers in Simulation
PaperNegative photoresists for optical lithography
- J.M. Shaw
- J. Gelorme
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- 1997
- IBM J. Res. Dev
PaperPyroelectric measurements on selected compounds with rich liquid crystalline polymorphism
- I. Dierking
- G. Andersson
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- 1997
- Ferroelectrics
PaperStochastic Complexity in Learning
- J. Rissanen
- 1997
- Journal of Computer and System Sciences
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