Electrochemical modification of La2CuO4: The role played by microstructure
- E.J. Williams
- A. Daridon
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paper
Publications
26911 results for Science
Cracking a tough NUT* with a big computer
- F.F. Abraham
- D. Schneider
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperDepth-sensitive strain analysis of a W/Ta/W trilayer
- S. Malhotra
- Z. Rek
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperToughened, inorganic-organic hybrid materials for microelectronic application
- J.L. Hedrick
- S.A. Srinivasan
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperChloroethane physisorbed on hydrogenated Si(111): A test system for the evaluation of core level XPS assignment rules at Si/SiO2 interfaces
- F.R. McFeely
- K.Z. Zhang
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperDiamondlike carbon materials as low-k dielectrics for multilevel interconnects in ULSI
- A. Grill
- V.V. Patel
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperThe relative value of labeled and unlabeled samples in pattern recognition with an unknown mixing parameter
- Vittorio Castelli
- Thomas M. Cover
- 1996
- IEEE Trans. Inf. Theory
PaperLinearity testing in characteristic two
- Mihir Bellare
- Don Coppersmith
- et al.
- 1996
- IEEE Trans. Inf. Theory
PaperPartially Hidden Markov models
- Søren Forchhammer
- Jorma Rissanen
- 1996
- IEEE Trans. Inf. Theory
PaperPractical reliable bayesian recognition of 2d and 3d objects using implicit polynomials and algebraic invariants
- Jayashree Subrahmonia
- David B. Cooper
- et al.
- 1996
- IEEE Transactions on Pattern Analysis and Machine Intelligence
Paper