In-situ X-ray diffraction analysis of TiSi2 phase formation from a titanium-molybdenum bilayer
- C. Cabral Jr.
- L. Clevenger
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paper
Publications
26934 results for Science
Diamondlike carbon materials as low-k dielectrics for multilevel interconnects in ULSI
- A. Grill
- V.V. Patel
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperElectrodeposition for Hi-MEMS with special reference to fabrication of a magnetic mini-motor
- E.J.M. O'Sullivan
- E.I. Cooper
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperDepth-sensitive strain analysis of a W/Ta/W trilayer
- S. Malhotra
- Z. Rek
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperElectrochemical modification of La2CuO4: The role played by microstructure
- E.J. Williams
- A. Daridon
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperChloroethane physisorbed on hydrogenated Si(111): A test system for the evaluation of core level XPS assignment rules at Si/SiO2 interfaces
- F.R. McFeely
- K.Z. Zhang
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperIn situ TEM analysis of TiSi2 C49-C54 transformations during annealing
- L. Gignac
- V. Svilan
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperToughened, inorganic-organic hybrid materials for microelectronic application
- J.L. Hedrick
- S.A. Srinivasan
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperCracking a tough NUT* with a big computer
- F.F. Abraham
- D. Schneider
- et al.
- 1996
- MRS Fall Meeting 1996
Conference paperThe relative value of labeled and unlabeled samples in pattern recognition with an unknown mixing parameter
- Vittorio Castelli
- Thomas M. Cover
- 1996
- IEEE Trans. Inf. Theory
Paper