Automatic defect classification for semiconductor manufacturing
- Paul B. Chou
- A. Ravishankar Rao
- et al.
- 1996
- Machine Vision and Applications
Paper
Publications
26911 results for Science
Nanolithography with an atomic force microscope
- M. Wendel
- B. Irmer
- et al.
- 1996
- Superlattices and Microstructures
PaperFermi surface and extended van Hove singularity in the non-cuprate layered perovskite superconductor Sr2RuO4
- D.H. Lu
- M. Schmidt
- et al.
- 1996
- Journal of Low Temperature Physics
PaperSurface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy
- M. Pfister
- M. Johnson
- et al.
- 1996
- Applied Surface Science
PaperComplexity and real computation: A manifesto
- Lenore Blum
- Felipe Cucker
- et al.
- 1996
- International Journal of Bifurcation and Chaos in Applied Sciences and Engineering
PaperOptical characterization of surfaces during epitaxial growth using RDS and GIXS
- I. Kamiya
- L. Mantese
- et al.
- 1996
- Journal of Crystal Growth
PaperOptimal reference electrode selection for electric source imaging
- N.G. Gençer
- S.J. Williamson
- et al.
- 1996
- Electroencephalography and Clinical Neurophysiology
PaperScaling silicon MOS devices to their limits
- S.J. Wind
- D.J. Frank
- et al.
- 1996
- Microelectronic Engineering
PaperConstrained shortest path algorithms for network control
- Boris S. Verkhovsky
- 1996
- International Journal of General Systems
PaperComparing Information Without Leaking It
- Ronald Fagin
- Moni Naor
- et al.
- 1996
- Communications of the ACM
Paper