X-ray lithography induced radiation effects in deep submicron CMOS devices
- L.K. Wang
- A. Acovic
- et al.
- 1993
- MRS Spring Meeting 1993
Conference paper
Publications
25372 results for Science
Spectromicroscopic study of corrosion in Al-Cu-Si metallization
- V. Brusic
- 1993
- MRS Proceedings 1993
Conference paperIncrease in period of oscillatory coupling in Cu by doping with Ni
- S.S.P. Parkin
- C. Chapper
- et al.
- 1993
- MRS Spring Meeting 1993
Conference paperEffect of annealing on the Cu distribution and Al2Cu precipitation in Al(Cu) thin films
- E.G. Colgan
- K.P. Rodbell
- et al.
- 1993
- MRS Proceedings 1993
Conference paperDetermination of the mechanical response of thin films with x-rays
- I.C. Noyan
- G. Sheikh
- 1993
- MRS Spring Meeting 1993
Conference paperSpin polarized low energy electron microscopy (SPLEEM) of single and combined layers of Co, Cu, and pd on W (110)
- H. Poppa
- H. Pinkvos
- et al.
- 1993
- MRS Spring Meeting 1993
Conference paperCombined electron and ion projection microscopy
- Heinz Schmid
- Hans-Werner Fink
- 1993
- Applied Surface Science
PaperDependence of giant magnetoresistance on Cu-layer thickness in Co/Cu multilayers: A simple dilution effect
- S.S.P. Parkin
- Anjenaya Modak
- et al.
- 1993
- Physical Review B
PaperPhotogenerated base as catalyst for imidization reactions - A new design of photosensitive polymers
- J.M.J. Fréchet
- J.F. Cameron
- et al.
- 1993
- Polymer Bulletin
PaperFirst-principles calculations of the instability leading to the Invar effect
- P. Entel
- E. Hoffmann
- et al.
- 1993
- Physical Review B
Paper