Interface traps induced by hole trapping in metal-oxide semiconductor devices
- Y. Roh
- L.P. Trombetta
- et al.
- 1995
- Journal of Non-Crystalline Solids
Paper
Publications
26909 results for Science
Atomic hydrogen-induced degradation of thin SiO2 gate oxides
- E. Cartier
- D.A. Buchanan
- et al.
- 1995
- Journal of Non-Crystalline Solids
PaperNanofoam porosity by infrared spectroscopy
- M.I. Sanchez
- J.L. Hedrick
- et al.
- 1995
- Journal of Polymer Science Part B: Polymer Physics
PaperThe effect of pressure on the band-gap energy in ordered GaInP and AlGaInP grown by MOVPE
- T. Kobayashi
- H. Kojima
- et al.
- 1995
- Journal of Physics and Chemistry of Solids
PaperPlasma Etching and Deposition for a-Si: H Thin Film Transistors
- Yue Kuo
- 1995
- JES
PaperControlling digital signature services using a smartcard
- Christopher J Holloway
- 1995
- Computers and Security
PaperNb/AIN/Nb Josephson Junctions with High Critical Current Density
- A.W. Kleinsasser
- R.E. Miller
- et al.
- 1995
- IEEE TAS
PaperDetermination of Helium presence in the mask/wafer gap of X-ray lithography steppers
- Juan R. Maldonado
- Ron DellaGuardia
- et al.
- 1995
- Microelectronic Engineering
PaperCMOS scaling into the 21st century: 0.1 μm and beyond
- Y. Taur
- Y. Mii
- et al.
- 1995
- IBM J. Res. Dev
PaperMagneto-optical and structural properties of DIG/T (T Fe, Co, Dy) multilayers
- J.X. Shen
- R.D. Kirby
- et al.
- 1995
- Journal of Magnetism and Magnetic Materials
Paper