E' centers and nitrogen-related defects in SiO2 films
- J.H. Stathis
- J. Chapple-Sokol
- et al.
- 1990
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
- Gerhard Meyer
- Nabil M. Amer
- 1990
- Applied Physics Letters
PaperX-ray spectromicroscopy with a zone plate generated microprobe
- Harald Ade
- Janos Kirz
- et al.
- 1990
- Applied Physics Letters
PaperExtended Jones matrix representation for the twisted nematic liquid-crystal display at oblique incidence
- Alan Lien
- 1990
- Applied Physics Letters
PaperPhotodarkening and bleaching in amorphous silicon nitride
- C.H. Seager
- Jerzy Kanicki
- 1990
- Applied Physics Letters
PaperMagnetically filtered low-loss scanning electron microscopy
- Oliver C. Wells
- Francoise K. LeGoues
- et al.
- 1990
- Applied Physics Letters
PaperArsenic precipitates and the semi-insulating properties of GaAs buffer layers grown by low-temperature molecular beam epitaxy
- Alan C. Warren
- J. Woodall
- et al.
- 1990
- Applied Physics Letters
PaperCritical current density of strained multilayer thin films of Nd 1.83Ce0.17CuOx/YBa2Cu 3O7-δ
- R. Gross
- A. Gupta
- et al.
- 1990
- Applied Physics Letters
PaperSelf-propagating explosive reactions in Al/Ni multilayer thin films
- E. Ma
- C.V. Thompson
- et al.
- 1990
- Applied Physics Letters
PaperControl of misoriented grains and pinholes in CoSi2 grown on Si(001)
- J.R. Jimenez
- L.M. Hsiung
- et al.
- 1990
- Applied Physics Letters
Paper