A full E-beam 0.25 mu m bipolar technology with sub-25 ps ECL gate delay
- J. Warnock
- J.D. Cressler
- et al.
- 1991
- IEDM 1991
Conference paper
Publications
24864 results for Exploratory Science
Experimental verification of the mechanism of hot-carrier-induced photon emission in n-MOSFET's with a CCD gate structure
- Hon-Sum Wong
- 1991
- IEDM 1991
Conference paperTrench storage capacitors for high density DRAMs
- T.V. Rajeevakumar
- T. Lii
- et al.
- 1991
- IEDM 1991
Conference paperUse of electron-beam irradiation to study performance degradation of bipolar transistors after reverse-bias stress
- Keith A. Jenkins
- J.D. Cressler
- et al.
- 1991
- IEDM 1991
Conference paperCharacterization of devices fabricated in films grown at low temperature by atmospheric pressure CVD
- T.O. Sedgwick
- V.P. Kesan
- et al.
- 1991
- IEDM 1991
Conference paperCorrelation between magnetic splitting and magnetic moment for 3d transition metals
- F.J. Himpsel
- 1991
- Journal of Magnetism and Magnetic Materials
PaperCritical behaviour of [110]-stressed rbcaf3
- J.Y. Buzaré
- W. Berlinger
- et al.
- 1991
- Ferroelectrics
PaperEffect of structural parameters on InGaAs/InAlAs 2DEG transport characteristics
- M.A. Tischler
- B.D. Parker
- et al.
- 1991
- Journal of Electronic Materials
PaperObservation of screw dislocations in sputtered YBa2Cu3O7-δ films
- D.G. Schlom
- D. Anselmetti
- et al.
- 1991
- Physica C: Superconductivity and its applications
PaperOptical study of the transition of doped potassium tantalate
- G. Banfi
- P. Camagni
- et al.
- 1991
- Ferroelectrics
Paper