High temperature stability and relaxation of UHV/CVD SiGe thin films
- S. Stiffler
- Carol Stanis
- et al.
- 1992
- MRS Fall Meeting 1992
Conference paper
Publications
26903 results for Science
Preparation and in-situ surface analysis of MNFE/NIFE exchange structures: interfacial impurity incorporation
- Susan L. Choen
- John M. Baker
- et al.
- 1993
- MRS Spring Meeting 1993
Conference paperParamagnetic nitrogen defects in silicon nitride
- W.L. Warren
- Jerzy Kanicki
- et al.
- 1992
- MRS Proceedings 1992
Conference paperResearch queueing package modeling environment (RESQME)
- Kow C. Chang
- Robert F. Gordon
- et al.
- 1992
- WSC 1992
Conference paperMeasurements of hydrogen redistribution in hot electron injection of MOS capacitors
- A.D. Marwick
- D.A. Buchanan
- et al.
- 1992
- MRS Proceedings 1992
Conference paperQuantitative measurement of dynamic deformations using pulsed holographic interferometry
- L. Crawforth
- A.C. Munce
- et al.
- 1993
- IMAC 1993
Conference paperOn the effectiveness of decoupling capacitors in reducing EM radiation from PCBs
- Shahrokh Daijavad
- H. Heeb
- 1993
- EMC 1993
Conference paperOptical preamplifier and receiver module for multichannel applications
- Karen Liu
- David Steinberg
- 1992
- SPIE Optics, Imaging, and Instrumentation 1992
Conference paperPlanar grating wavelength demultiplexer
- Karen Liu
- F. Tong
- et al.
- 1992
- SPIE Optics, Imaging, and Instrumentation 1992
Conference paperExcimer laser as a source for thin Cu film deposition for use in electronic device fabrication
- A. Sugerman
- Bodil Braren
- et al.
- 1993
- SPIE OE/LASE 1993
Conference paper