Bloch line influence on wall motion response in thin-film heads
- B.E. Argyle
- B. Petek
- et al.
- 1988
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Electrical characteristics of Ti/Si(100) interfaces
- M.O. Aboelfotoh
- 1988
- Journal of Applied Physics
PaperEffect of material constants on the orientation structure of ferroelectric liquid crystal cells
- Trieu C. Chieu
- 1988
- Journal of Applied Physics
PaperPlasma-assisted etching of tungsten films: A quartz-crystal microbalance study
- F. Fracassi
- J.W. Coburn
- 1988
- Journal of Applied Physics
PaperAsymmetries in dislocation densities, surface morphology, and strain of GaInAs/GaAs single heterolayers
- K.L. Kavanagh
- M.A. Capano
- et al.
- 1988
- Journal of Applied Physics
PaperDegradation of bipolar transistors under high current stress at 300 K
- R.A. Wachnik
- T. Bucelot
- et al.
- 1988
- Journal of Applied Physics
PaperSurface-oxidation-induced phase separation in FeMn thin films
- H. Lefakis
- T.C. Huang
- et al.
- 1988
- Journal of Applied Physics
PaperShapiro steps on current-voltage curves of dc SQUIDs
- C. Vanneste
- C.C. Chi
- et al.
- 1988
- Journal of Applied Physics
PaperElectro-optical properties of guest-host nematic liquid-crystal displays
- Hiap Liew Ong
- 1988
- Journal of Applied Physics
PaperTransport properties in amorphous Ux-T1-x films (T=Fe, Ni, Gd, Tb, and Yb) (invited)
- P. Freitas
- T.S. Plaskett
- et al.
- 1988
- Journal of Applied Physics
Paper