Influence of surfactants in Ge and Si epitaxy on Si(001)
- M. Copel
- M.C. Reuter
- et al.
- 1990
- Physical Review B
Paper
Publications
25372 results for Science
Oxygen on Cu(100) surface structure studied by scanning tunneling microscopy and by low-energy-electron-diffraction multiple-scattering calculations
- Ch. Wöll
- R.J. Wilson
- et al.
- 1990
- Physical Review B
PaperThe pyroelectric thin film sensor: A novel tool for the analysis of thin films
- H.J Coufal
- 1990
- Thin Solid Films
PaperStrong intermediate-state effects in exciton-mediated electronic intrasubband scattering in multiple-quantum-well structures
- M. Berz
- J.F. Walker
- et al.
- 1990
- Physical Review B
PaperMicrostructure and strain relief of Ge films grown layer by layer on Si(001)
- F. Legoues
- M. Copel
- et al.
- 1990
- Physical Review B
PaperMaterial dependence of property modification in ion-assisted evaporation of iron, nickel and cobalt
- R.A. Roy
- R. Petkie
- et al.
- 1990
- Surface and Coatings Technology
PaperFine-Grain Analysis (FGA): A Methodology for Analyzing Intermittent Performance Problems
- Robert Berry
- Jeffrey Hedglin
- et al.
- 1990
- CMG 1990
Conference paperFull-wave analysis of counectors in high-speed computer packages
- Moises Cases
- Barry J. Rubin
- 1990
- International Conference on Infrared and Millimeter Waves 1990
Conference paperAccurate full-wave approach for modeling patch antennas
- Barry J. Rubin
- R.A. York
- et al.
- 1990
- International Conference on Infrared and Millimeter Waves 1990
Conference paperExpert Systems for Capacity Management
- Robert Berry
- Joseph Hellerstein
- 1990
- CMG 1990
Conference paper