Fast confocal image processing for inspection
- A.Ravishankar Rao
- F.Y. Wu
- et al.
- 1992
- SPIE Aerospace Sensing 1992
Conference paper
Publications
26898 results for Science
New techniques for patterned wafer inspection based on a model of human preattentive vision
- Virginia H. Brecher
- 1992
- SPIE Aerospace Sensing 1992
Conference paperDesorption of hydrogen from Si(100)2×1 at low coverages: The influence of -bonded dimers on the kinetics
- U. Höfer
- Leping Li
- et al.
- 1992
- Physical Review B
PaperMissing dimers and strain relief in Ge films on Si(100)
- 1992
- Physical Review B
PaperUnderpotentially deposited thallium on silver (111) by in situ surface x-ray scattering
- Michael F. Toney
- Joseph G. Gordon
- et al.
- 1992
- Physical Review B
PaperExcitonic enhancement of the Fermi-edge singularity in a dense two-dimensional electron gas
- W. Chen
- M. Fritze
- et al.
- 1992
- Physical Review B
PaperLow energy ion-assisted deposition of metal films
- Ronnen Roy
- 1992
- Surface and Coatings Technology
PaperAdiabaticity in first-principles molecular dynamics
- Peter E. Blöchl
- M. Parrinello
- 1992
- Physical Review B
PaperNonspectroscopic approach to the determination of the chemical potential and band-gap renormalization in quantum wells
- E.H. Böttcher
- N. Kirstaedter
- et al.
- 1992
- Physical Review B
PaperMonte Carlo diagonalization of many-body problems: Application to fermion systems
- Hans De Raedt
- Wolfgang Von Der Linden
- 1992
- Physical Review B
Paper