Radiation damage and its effect on hot-carrier induced instability of 0.5 μm CMOS devices patterned using synchrotron x-ray lithography
- C.C.-H. Hsu
- L.K. Wang
- et al.
- 1990
- Journal of Electronic Materials
Paper
Publications
25372 results for Science
Phase boundary of superconducting networks: A new approximation scheme
- C.C. Chi
- P. Santhanam
- et al.
- 1990
- Physical Review B
PaperPhysical modeling of ductile fracture during metalforming process
- A.S. Kao
- H.A. Kuhn
- 1990
- Journal of Engineering Materials and Technology, Transactions of the ASME
PaperIon implantation in gallium arsenide mesfet technology
- J.P. De Souza
- D.K. Sadana
- 1990
- Congress of the Brazilian Society of Microelectronics 1990
Conference paperUniversal scaling of nonlocal and local resistance fluctuations in small wires
- H. Haucke
- S. Washburn
- et al.
- 1990
- Physical Review B
PaperPosition of the empty surface-state band on Si(111)2×1
- A. Cricenti
- S. Selci
- et al.
- 1990
- Physical Review B
PaperLocal catalytic effect of cesium on the oxidation of silicon
- Hans-Joachim Ernst
- Ming L. Yu
- 1990
- Physical Review B
PaperCarrier dynamics of electrons and holes in moderately doped silicon
- Martin Van Exter
- D. Grischkowsky
- 1990
- Physical Review B
PaperGrowth of silicon and germanium on Cu(111) studied by angle-resolved direct and inverse photoemission
- R. Dudde
- H. Bernhoff
- et al.
- 1990
- Physical Review B
PaperConfirmation of the temperature-dependent photovoltaic effect on Fermi-level measurements by photoemission spectroscopy
- S. Chang
- I.M. Vitomirov
- et al.
- 1990
- Physical Review B
Paper