Nucleation of an intermetallic at thin-film interfaces: VSi2 contrasted with Al3Ni
- E. Ma
- L. Clevenger
- et al.
- 1992
- Journal of Materials Research
Paper
Publications
26937 results for Science
Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits
- H. Heinrich
- N. Pakdaman
- et al.
- 1992
- Microelectronic Engineering
PaperShallow junctions, silicide requirements and process technologies for sub 0.5 μm CMOS. Invited review paper
- Bijan Davari
- 1992
- Microelectronic Engineering
PaperIsotope effect in La2-xSrxCuO4 superconductors
- Maria Ronay
- M.A. Frisch
- et al.
- 1992
- Physical Review B
PaperGray-scale addressing technique for thin-film-transistor/liquid crystal displays
- P.M. Alt
- C.G. Powell
- et al.
- 1992
- IBM J. Res. Dev
PaperOn the influence of surface temperature on adsorption and desorption in the D2/Cu(111) system
- H.A. Michelsen
- C.T. Rettner
- et al.
- 1992
- Surface Science
PaperApplication of electron and ion beam analysis techniques to microelectronics
- T.S. Kuan
- P.E. Batson
- et al.
- 1992
- IBM J. Res. Dev
PaperDirect observation of the critical state field profile in a YBa2Cu3O7-y single crystal
- T. Tamegai
- L. Krusin-Elbaum
- et al.
- 1992
- Physical Review B
PaperSystematic study of insulator-metal transitions in perovskites RNiO3 (R=Pr,Nd,Sm,Eu) due to closing of charge-transfer gap
- J.B. Torrance
- P. Lacorre
- et al.
- 1992
- Physical Review B
PaperLateral field effect in twisted nematic cells
- Alan Lien
- R.A. John
- 1992
- IBM J. Res. Dev
Paper