In situ resistivity measurement of cobalt silicide formation
- G. Ottaviani
- K.N. Tu
- et al.
- 1987
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
The capture barrier of the DX center in Si-doped AlxGa 1-xAs
- P.M. Mooney
- N. Caswell
- et al.
- 1987
- Journal of Applied Physics
PaperLow-frequency noise in self-aligned bipolar transistors
- Pong-Fei Lu
- 1987
- Journal of Applied Physics
PaperMicrofields in stroboscopic voltage measurements via electron emission. I. Response function of the potential energy
- Rolf Clauberg
- 1987
- Journal of Applied Physics
PaperRapid thermal annealing of hydrogenated amorphous silicon grown at low temperature
- P. Fiorini
- I. Haller
- et al.
- 1987
- Journal of Applied Physics
PaperRole of oxygen in defect-related breakdown in thin SiO2 films on Si (100)
- K. Hofmann
- G.W. Rubloff
- et al.
- 1987
- Journal of Applied Physics
PaperMagnetic correlations in an amorphous Gd-Al spin glass
- M.L. Spano
- J.J. Rhyne
- et al.
- 1987
- Journal of Applied Physics
PaperPhotoemission sampling measurements of a dispersing voltage pulse traveling on a transmission line
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Journal of Applied Physics
PaperRandom-exchange and random-field xy chain for s=1/2
- T. Schneider
- A. Politi
- 1987
- Journal of Applied Physics
PaperLattice imaging of metastable TiSi2
- T.C. Chou
- C.Y. Wong
- et al.
- 1987
- Journal of Applied Physics
Paper