Secondary ion mass spectrometry measurements of deuterium penetration into silicon by low pressure rf glow discharges
- Gottlieb S. Oehrlein
- Gerald J. Scilla
- 1989
- Radiation Effects and Defects in Solids
Paper
Publications
25372 results for Science
Negative magnetoresistance in small superconducting loops and wires
- P. Santhanam
- C.P. Umbach
- et al.
- 1989
- Physical Review B
PaperPhotoelectron spectroscopic study of the interaction of thin Fe films with the MoS2(0001) surface
- Jeffrey R. Lince
- Thomas B. Stewart
- et al.
- 1989
- Surface Science
PaperDielectric relaxation spectroscopy and the ground state of K 1-xLixTaO3
- U.T. Hochli
- M. Maglione
- 1989
- Journal of Physics Condensed Matter
PaperConductance determined by transmission: Probes and quantised constriction resistance
- R. Landauer
- 1989
- Journal of Physics Condensed Matter
PaperProperties of epitaxial films of γ-Fe and γ-Mn
- F. Jona
- P.M. Marcus
- 1989
- Surface Science
PaperSpectroscopy with the scanning tunnelling microscope: A critical review
- R.M. Tromp
- 1989
- Journal of Physics Condensed Matter
ReviewAn integrated algorithm for probabilistic protocol verification and evaluation
- Dragomir D. Dimitrijevic
- Mon-Song Chen
- 1989
- IEEE INFOCOM 1989
Conference paperA new planarization technique, using a combination of RIE and chemical mechanical polish (CMP)
- B. Davari
- C. Koburger
- et al.
- 1989
- IEDM 1989
Conference paperLaser transfer of organic adsorbates: a test case using coronene surface patterns transferred with micrometer resolution to IR Windows
- M. DeVries
- H.E. Hunziker
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paper