Metrology using differential phase contrast microscopy
- Jerry C. Shaw
- 1991
- Microelectronic Engineering
Paper
Publications
26938 results for Science
X-ray photoelectron spectroscopy of oxygen adsorbates on Al(111): Theory experiment
- P.S. Baqus
- F. Parmiqiani
- et al.
- 1991
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperA note on the determination of influence lines and surfaces using finite elements
- Arturo Cifuentes
- Mario Paz
- 1991
- Finite Elements in Analysis and Design
PaperAerosol problems in clean technologies for microelectronics
- Douglas W. Cooper
- 1991
- Journal of Aerosol Science
PaperOptimal Allocation of a Server Between two Queues with Due Times
- Partha P. Bhattacharya
- Anthony Ephremides
- 1991
- IEEE TACON
PaperOptical study of plasmons in Tl2Ba2Ca2Cu3O10
- Ivan Boović
- J.H. Kim
- et al.
- 1991
- Physical Review B
PaperAdhesion and XPS studies on a fluoropolymer-metal interface
- Jae M. Park
- L.J. Matienzo
- et al.
- 1991
- Journal of Adhesion Science and Technology
PaperEnergetics of La2-xSrxCuO4-y solid solutions (0.0 ≤ x ≤ 1.0)
- Joseph Bularzik
- Alexandra Navrotsky
- et al.
- 1991
- Journal of Solid State Chemistry
PaperStochastic Convexity for Multidimensional Processes and Its Applications
- Cheng-Shang Chang
- Xiuli Chao
- et al.
- 1991
- IEEE TACON
PaperEffect of local alloy disorder on the emission kinetics of deep donors (DX centers) in AlxGa1-xAs
- P.M. Mooney
- T.N. Theis
- et al.
- 1991
- Journal of Electronic Materials
Paper