Threshold voltage control in NiSi-gated MOSFETs through silicidation induced impurity segregation (SIIS)Jakub KedzierskiDiane Boydet al.2003IEDM 2003Conference paper
Investigation of Scaling Methodology for Strained Si n-MOSFETs Using a Calibrated Transport ModelHasan M. NayfehJudy L. Hoytet al.2003IEDM 2003Conference paper
High Performance CMOS Fabricated on Hybrid Substrate with Different Crystal OrientationsM. YangM. Ieonget al.2003IEDM 2003Conference paper
Thousands of Microcantilevers for Highly Parallel and Ultra-dense Data StorageP. VettigerT.R. Albrechtet al.2003IEDM 2003Conference paper
Device Design Considerations for Ultra-Thin SOI MOSFETsB. DorisM. Ieonget al.2003IEDM 2003Conference paper