Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Conference paper
Publications
14 results at IRPS 2011
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Conference paperSpectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)
- Ulrike Kindereit
- Oana-Mihaela Mutihac
- et al.
- 2011
- IRPS 2011
Conference paperImpact of source/drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs
- Rajan Arora
- Sachin Seth
- et al.
- 2011
- IRPS 2011
Conference paper