Publications

14 results at IEDM 2010

Device, circuit and system-level analysis of noise in multi-bit phase-change memory
- - Gael F. Close
  - Urs Frey
  - et al.
- 2010
- IEDM 2010
High reliability 32 nm Cu/ULK BEOL based on PVD CuMn seed, and its extendibility
- - Takeshi Nogami
  - Tibor Bolom
  - et al.
- 2010
- IEDM 2010
Reliability and structural design of a wafer-level 3D integration scheme with W TSVs based on Cu-oxide hybrid wafer bonding
- - K.N. Chen
  - T.M. Shaw
  - et al.
- 2010
- IEDM 2010
Wafer scale fabrication of carbon nanotube FETs with embedded poly-gates
- - Shu-Jen Han
  - Josephine Chang
  - et al.
- 2010
- IEDM 2010