Contactless electromodulation for in situ characterization of semiconductor processing
- X. Yin
- X. Guo
- et al.
- 1993
- Applied Surface Science
Paper
Publications
3553 results for Materials Discovery
Effects of residual stresses in the blister test
- H.M. Jensen
- M.D. Thouless
- 1993
- Int. J. Solids Struct.
PaperEffects of ion bombardment in plasma etching on the fluorinated silicon surface layer: Real-time and postplasma surface studies
- Gottlieb S. Oehrlein
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperThe first doping of lead2+ into the bismuth oxide layers of the aurivillius oxides
- P. Millán
- A. Castro
- et al.
- 1993
- Materials Research Bulletin
PaperDirectionality of Sputtered Cu Atoms in A Hollow Cathode Enhanced Planar Magnetron
- S.M. Rossnagel
- J.J. Cuomo
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperThe instability of the steady flow past spheres and disks
- Ramesh Natarajan
- Andreas Acrivos
- 1993
- Journal of Fluid Mechanics
PaperNew fluid model for the turbulent transport due to the ion temperature gradient
- Chang-Bae Kim
- Wendell Horton
- et al.
- 1993
- Physics of Fluids B
PaperMeasurement of the fracture toughness of polymer-non-polymer interfaces
- J.W. Smith
- E.J. Kramer
- et al.
- 1993
- Journal of Materials Science
PaperReactive Ion Etching of Sige Alloys using Fluorine-Containing Plasmas *
- James W. Corbett
- Gottlieb S. Oehrlein
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperDomain Formation and System-Size Dependence in Simulations of Self-Assembled Monolayers
- J. Ilja Siepmann
- Ian R. McDonald
- 1993
- Langmuir
Paper