A classification scheme for visual defects arising in semiconductor wafer inspection
- A. Ravishankar Rao
- Ramesh Jain
- 1990
- Journal of Crystal Growth
Paper
Publications
26883 results for Science
Efficient parallel algorithms for graph problems
- Clyde P. Kruskal
- Larry Rudolph
- et al.
- 1990
- Algorithmica
PaperPositron-annihilation lifetime in the high-Tc Oxides
- Vladimir Z. Kresin
- H. Morawitz
- 1990
- Journal of Superconductivity
PaperLaser-induced etching of titanium by Br2 and CCl3Br at 248 nm
- George W. Tyndall
- Christopher R. Moylan
- 1990
- Applied Physics A Solids and Surfaces
PaperPlastics. The sine qua non of electronics packaging
- P.A. Moskowitz
- C.A. Kovac
- 1990
- Plastics Engineering
PaperA camera calibration technique using three sets of parallel lines
- Tomio Echigo
- 1990
- Machine Vision and Applications
PaperThe propagation of cracks and crack-like defects in thin adhered polymer films
- H.R. Brown
- A.C.M. Yang
- 1990
- Journal of Materials Science
PaperBogoliubov quasiparticles, spinons, and spin-charge decoupling in superconductors
- S. Kivelson
- D.S. Rokhsar
- 1990
- Physical Review B
PaperMixed-mode effects on the toughness of polymer interfaces
- H.R. Brown
- 1990
- Journal of Materials Science
PaperModal sensors/actuators
- Chih-Kung Lee
- F.C. Moon
- 1990
- Journal of Applied Mechanics, Transactions ASME
Paper